Product Information | NuFlare Technology, Inc. /english/products/ Thu, 16 Mar 2023 08:01:25 +0000 ja hourly 1 https://wordpress.org/?v=6.7.1 /wp-content/uploads/common/cropped-favicon-32x32.png Product Information | NuFlare Technology, Inc. /english/products/ 32 32 Multi-EB Mask Writer MBM™-2000PLUS /english/products/beam/mbm_2000plus/ Mon, 20 Feb 2023 02:15:09 +0000 /?post_type=products-en&p=5127 Multi-EB Mask Writer " MBM™-2000 " for 3nm+ Node Design Rule Features 1) Excellent accuracy of 260,000 beams. …

投稿 Multi-EB Mask Writer MBM™-2000<strong>PLUS</strong>株式会社ニューフレアテクノロジー に最初に表示されました。

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MB Mask Writer MBM-2000PLUS

Multi-EB Mask Writer " MBM™-2000 " for 3nm+ Node Design Rule

Features

  • 1) Excellent accuracy of 260,000 beams.
  • 2) MBF2.0 date format enables fast write time of complex curvilinear patterns.
  • 3) High throughput and high-precision writing regardless of complex patterns.

Key Parameters

Key Parameters
Mask size 6inch
Image placement 1.3nm(3σ)
Local CD uniformity 0.65nm(3σ)

投稿 Multi-EB Mask Writer MBM™-2000<strong>PLUS</strong>株式会社ニューフレアテクノロジー に最初に表示されました。

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EPIREVO™ S8 8” single-wafer SiC Epitaxial Reactor /english/products/epitaxial/epirevo_s8/ Wed, 23 Nov 2022 11:15:58 +0000 /?post_type=products-en&p=4099 EPIREVO™ S8 enables high productivity through its 8 inch capability with same configuration and same footprint…

投稿 EPIREVO™ S8 8” single-wafer SiC Epitaxial Reactor株式会社ニューフレアテクノロジー に最初に表示されました。

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EPIREVO S8 8 single-wafer SiC Epitaxial Reactor

EPIREVO™ S8 enables high productivity through its 8 inch capability with same configuration and same footprint as EPIREVO™ S6 for 6 inch wafers.

Features

High productivity

  • High growth rate: > 50 µm/hour
  • Long maintenance cycle

Low defect density

  • Minimum downfall density onto wafer
  • Long term low defect density

Highly quality

  • Excellent uniformity(σ/mean) Thickness uniformity : < 2 % (E.E=5 mm) Doping uniformity : < 5 % (E.E.=5 mm)

Excellent wafer temperature control

  • 2 points direct temperature monitoring
  • Independent temperrature control of IN and OUT heaters

投稿 EPIREVO™ S8 8” single-wafer SiC Epitaxial Reactor株式会社ニューフレアテクノロジー に最初に表示されました。

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Multi-EB Mask Writer MBM™-2000 /english/products/beam/mbm_2000/ Wed, 23 Nov 2022 08:04:36 +0000 /?post_type=products-en&p=4042 Multi-EB Mask Writer " MBM™-2000 " for 3nm Node Design Rule Features 1) Excellent accuracy of 260,000 beams. 2…

投稿 Multi-EB Mask Writer MBM™-2000株式会社ニューフレアテクノロジー に最初に表示されました。

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MB Mask Writer MBM-2000

Multi-EB Mask Writer " MBM™-2000 " for 3nm Node Design Rule

Features

  • 1) Excellent accuracy of 260,000 beams.
  • 2) PLDC(Pixel Level Dose Correction)technology enables writing in greater contrast.
  • 3) High throughput and high-precision writing regardless of complex patterns.

Key Parameters

Key Parameters
Mask size 6inch
Image placement 1.4nm(3σ)
Local CD uniformity 0.7nm(3σ)

投稿 Multi-EB Mask Writer MBM™-2000株式会社ニューフレアテクノロジー に最初に表示されました。

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EB Mask Writer EBM-9500 /english/products/beam/ebm_9500/ Wed, 23 Nov 2022 07:56:26 +0000 /?post_type=products-en&p=4032 Variable EB Mask Writer system "EBM-9500PLUS" for 7nm+/5nm node. Features 1) 50kV acceleration voltage enables…

投稿 EB Mask Writer EBM-9500株式会社ニューフレアテクノロジー に最初に表示されました。

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EB Mask Writer EBM-9500PLUS

Variable EB Mask Writer system "EBM-9500PLUS" for 7nm+/5nm node.

Features

  • 1) 50kV acceleration voltage enables writing in greater contrast.
  • 2) Multiple pass writing method improves the performance of shot stitching.
  • 3) Low COO(Cost of Ownership)

Key Parameters

Key Parameters
Mask size 6inch
Image placement 1.8nm(3σ)
Local CD uniformity 1.3nm(3σ)

投稿 EB Mask Writer EBM-9500株式会社ニューフレアテクノロジー に最初に表示されました。

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Variable EB Mask Writer EBM-8000P/H・EBM-8000P/M /english/products/beam/ebm_8000p/ Wed, 23 Nov 2022 07:48:00 +0000 /?post_type=products-en&p=4026 Variable EB Mask Writer system "EBM-8000P/H, EBM-8000P/M" for 45~14nm node. Features 1) 50kV acceleration volt…

投稿 Variable EB Mask Writer EBM-8000P/H・EBM-8000P/M株式会社ニューフレアテクノロジー に最初に表示されました。

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EB Mask Writer BM-8000P/H・EBM-8000P/M

Variable EB Mask Writer system "EBM-8000P/H, EBM-8000P/M" for 45~14nm node.

Features

  • 1) 50kV acceleration voltage enables writing in greater contrast.
  • 2) High throughput with variable stage speed and high current density(400A/㎠)
  • 3) Low COO( Cost of Ownership )for wide range technology node.

Key Parameters

Key Parameters
Key Parameters EBM-8000P/H EBM-8000P/M
Mask size 6inch 6inch
Image placement 4.3nm(3σ) 6.0nm(3σ)
Local CD uniformity 1.3nm(3σ) 2.5nm(3σ)

投稿 Variable EB Mask Writer EBM-8000P/H・EBM-8000P/M株式会社ニューフレアテクノロジー に最初に表示されました。

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EPIREVO™ G8 8” single-wafer GaN-on-Si MOCVD /english/products/epitaxial/epirevo_g8/ Thu, 27 Oct 2022 09:57:36 +0000 /?post_type=products-en&p=3203 The EPIREVO™ G8 MOCVD system deposits high quality GaN films at high growth-rate on 8 inch Si substrates. EPIR…

投稿 EPIREVO™ G8 8” single-wafer GaN-on-Si MOCVD株式会社ニューフレアテクノロジー に最初に表示されました。

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EPIREVO G8 Single Wafer MOCVD

The EPIREVO™ G8 MOCVD system deposits high quality GaN films at high growth-rate on 8 inch Si substrates. EPIREVO™ G8 enables low cost LED production as well as high performance power-device applications, both of which help Society reduce its carbon foot print.

Features

High productivity

  • High GaN growth rate : > 9 µm/hour
  • Fast temperature ramp rate : > 200 ℃/minute

Highly quality

  • 8 inch wafer temperature uniformity : < 2 ℃
  • 1100 ℃ Slip free, Si melt-back free

Low cost

  • High TMG utilization ratio: > 20 %
  • High system uptime by in-situ cleaning

投稿 EPIREVO™ G8 8” single-wafer GaN-on-Si MOCVD株式会社ニューフレアテクノロジー に最初に表示されました。

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HT2000FD 8” single-wafer Epitaxial Reactor /english/products/epitaxial/ht2000fd/ Thu, 27 Oct 2022 09:38:27 +0000 /?post_type=products-en&p=3183 HT2000FD can deposit high quality epitaxial films at a low cost, contributing in improved performance and cost…

投稿 HT2000FD 8” single-wafer Epitaxial Reactor株式会社ニューフレアテクノロジー に最初に表示されました。

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HT2000FD Single Wafer Epitaxial Reactor

HT2000FD can deposit high quality epitaxial films at a low cost, contributing in improved performance and cost reduction of power devices. HT2000FD is an innovative, highly efficient and energy-saving epitaxial reactor capable of depositing films with a thickness of several micrometers to more than 150 µm continuously at a high speed by means of a vertical gas flow and high-speed wafer rotation.

Realize high-speed growth of ultra-thick epi film.

The reactor realized 8.5µm/min. of high-speed growth and less than ±1% of thickness uniformity simultaneously for 170µm of ultra-thick film.

High-speed growth of ultra-thick epi film.

Features

High productivity

  • Continuous growth of more than 150µm of thick film.
  • High-speed growth of more than 8µm/min.

Energy-saving

  • Low power consumption of 120 kVA or less.

Highly efficient

  • 20 to 30% of high gas conversion rate.
  • Very small amount of by-products

High quality

  • With a 150µm of film thickness
  • ±1.5% or less of thickness uniformity
  • ±3.0% or less of resistivity uniformity

Robot Wafer Handling

  • Cassette to Cassette operation

投稿 HT2000FD 8” single-wafer Epitaxial Reactor株式会社ニューフレアテクノロジー に最初に表示されました。

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EPIREVO™ S6 6” single-wafer SiC Epitaxial Reactor /english/products/epitaxial/epirevo_s6/ Thu, 27 Oct 2022 08:15:11 +0000 /?post_type=products-en&p=3160 EPIREVO™ S6 combines improved SiC power device quality with low cost production. The EPIREVO™ S6 realizes high…

投稿 EPIREVO™ S6 6” single-wafer SiC Epitaxial Reactor株式会社ニューフレアテクノロジー に最初に表示されました。

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EPIREVO S6 Single Wafer Epitaxial Reactor

EPIREVO™ S6 combines improved SiC power device quality with low cost production. The EPIREVO™ S6 realizes high productivity through its 6 inch capability, greater than 50µm/hour growth rate and high temperature wafer handling.

Features

High productivity

  • Continuous growth : 150 µm film.
  • High growth rate: > 50 µm/hour.
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Excellent wafer temperature uniformity

  • 4” wafer : < 1 ℃
  • 6” wafer : < 2 ℃

Highly quality

  • Excellent uniformity(σ/mean)
    Thickness uniformity : < 2 %
    (E.E=3 mm)
    Doping uniformity : < 4 %
    (E.E.=6 mm)
  • Low defect density: 0.02/cm-2

Auto wafer transfer by robot

  • Cassette to Cassette wafer transfer

投稿 EPIREVO™ S6 6” single-wafer SiC Epitaxial Reactor株式会社ニューフレアテクノロジー に最初に表示されました。

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